Investigation of the impact of insulator material on the performance of dissimilar electrode metal-insulator-metal diodes

نویسندگان

  • Nasir Alimardani
  • Sean W. King
  • Benjamin L. French
  • Cheng Tan
  • Benjamin P. Lampert
  • John F. Conley
چکیده

Articles you may be interested in Conduction processes in metal–insulator–metal diodes with Ta2O5 and Nb2O5 insulators deposited by atomic layer deposition Impact of top electrode on electrical stress reliability of metal-insulator-metal capacitor with amorphous ZrTiO 4 film Appl. Influence of the electrode material on Hf O 2 metal-insulator-metal capacitors High-temperature conduction behaviors of HfO 2 / TaN-based metal-insulator-metal capacitors Thin film solid-state reactions forming carbides as contact materials for carbon-containing semiconductors The performance of thin film metal-insulator-metal (MIM) diodes is investigated for a variety of large and small electron affinity insulators using ultrasmooth amorphous metal as the bottom electrode.

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تاریخ انتشار 2014